Data from Vince Crist (https://xpslibrary.com/b-vincent-crist-ceo/). The spectrum is good enough to determine the Lorentzian width, which resulted different from bulk silicon. (US Government data copyright number TX 4-560-881.)
Read moreSample material: Quartz
Elements: Si, O
Sample composition: SiO2
Brand: Kratos
Software used: Analyzer