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    Information about the sample:

    • Shape: Flat surface

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_982_image_14.jpg
  • try it
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_979_image_14.jpg
  • try it
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_978_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ir

    • Elements: Ir

    • Sample composition: Ir

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_972_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: W

    • Elements: W

    • Sample composition: W

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_971_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: W

    • Elements: W

    • Sample composition: W

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_970_image_14.jpg
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    Information about the sample:

    • Sample material: Os

    • Elements: Os

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_964_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Bi

    • Elements: Bi

    • Sample composition: Bi

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_963_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pt

    • Elements: Pt

    • Sample composition: Pt

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_962_image_14.jpg
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    Information about the sample:

    • Sample material: Hg

    • Elements: Hg

    • Sample composition: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_961_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Au

    • Elements: Au

    • Sample composition: Au

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_960_image_14.jpg
  • Fitting of spectra from the core level Fe 3p and 3s from a partially oxidized iron film for different photon energies (6736.5 and 7487.5 eV).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_959_image_14.jpg
  • Fitting of spectra from the core level Fe 3p and 3s from a partially oxidized iron film for different photon energies (6736.5 and 7487.5 eV).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_958_image_14.jpg
  • Fitting of spectra from the core level Fe 2s from a partially oxidized iron film for different photon energies (6736.5, 6836.5, 6936.5, 7387.5, 7487.5, and 7587.5 eV).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_957_image_14.jpg
  • Fitting of spectra from the core level O 1s from a partially oxidized iron film for different photon energies (6736.5, 6836.5, 6936.5, 7387.5, 7487.5, and 7587.5 eV).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_956_image_14.jpg
  • Fitting of spectra from the core level Fe 2p from a partially oxidized iron film for different photon energies (from top to botton 6836.5, 6736.5, 7587.5, and 7387.5 eV).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_955_image_14.jpg
  • Fitting of intrinsic Fe 2p signals for different photon energies (from top to botton 6836.5, 6736.5, 7587.5, and 7387.5 eV). The original spectra were analyzed under the Active background approach. The intrinsic signals were then obtained by modeling the extrinsic inelastic background accounting for the finite thickness (18 nm) of the oxide layer, a semi-infinite metal layer and X-ray extinction with a modified version of the method proposed by Herrera-Gomez Alberto, The photoemission background signal due to inelastic scattering in conformal thin layers, Queretaro, 2023.
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_954_image_14.jpg
  • Fitting of intrinsic O 1s signals for different photon energies (6736.5, 6836.5, 6936.5, 7387.5, 7487.5, and 7587.5 eV). The original spectra were analyzed under the Active background approach. The intrinsic signals were then obtained by modeling the extrinsic inelastic background accounting for the finite thickness (18 nm) of the oxide layer and X-ray extinction with a modified version of the method proposed by Herrera-Gomez Alberto, The photoemission background signal due to inelastic scattering in conformal thin layers, Queretaro, 2023.
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: partially oxidized Fe

    • Elements: Fe,O

    • Sample composition: Fe2O3/Fe

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_953_image_14.jpg
  • Fitting of the Te 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_945_image_14.jpg
  • Fitting of the Sb 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_944_image_14.jpg
  • Fitting of the Sn 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_943_image_14.jpg
  • Fitting of the In 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_942_image_14.jpg
  • Fitting of the Cd 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_941_image_14.jpg
  • Fitting of the Ag 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_940_image_14.jpg
  • metallic palladium sample Fitting of the Pd 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_939_image_14.jpg
  • Fitting of the Rh 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_938_image_14.jpg
  • Fitting of the Ru 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_937_image_14.jpg
  • Fitting of the Mo 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_936_image_14.jpg
  • Fitting of the Nb 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_935_image_14.jpg
  • Fitting of the Zr 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_934_image_14.jpg
  • Fitting of the Y 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_933_image_14.jpg
  • Fitting of the Rb 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_932_image_14.jpg
  • Fitting of the Sr 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The main peak was fitted with an asymmetric double-Lorentzian lineshape. The total background was modeled with a combination of a Tougaard type background and the interchannel coupling with valence band losses background.
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_931_image_14.jpg
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    Files :

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    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_924_image_14.jpg
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    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_923_image_14.jpg
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_922_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Metallic Mn

    • Elements: Mn, O

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_920_image_14.jpg
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    Files :

    • You must be logged-in to download data

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_918_image_14.jpg
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    Files :

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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_916_image_14.jpg
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    Files :

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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_915_image_14.jpg
  • Read more

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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_914_image_14.jpg
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_913_image_14.jpg
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_912_image_14.jpg
  • metallic bismuth fit, performed with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Bi

    • Elements: Bi

    • Sample composition: Bi

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_911_image_14.jpg
  • Lead adjustment with a little oxide, made with a correlated doublet and the shape of the double Lorentzian curve with a narrow Shirley background
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pb

    • Elements: Pb

    • Sample composition: Pb

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_909_image_14.jpg
  • Metallic thallium fit performed with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Tl

    • Elements: Tl

    • Sample composition: Tl

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_908_image_14.jpg
  • Metallic Gold adjustment made with a correlated doublet and the shape of the double Lorentzian curve with narrow Shirley background, this does not present Shirley background
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hg

    • Elements: Hg

    • Sample composition: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_907_image_14.jpg
  • Metallic Gold adjustment made with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Au

    • Elements: Au

    • Sample composition: Au

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_906_image_14.jpg
  • Platinum metal tuning performed with a correlated doublet and the shape of the double Lorentzian curve with bacgrond narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pt

    • Elements: Pt

    • Sample composition: Pt

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_905_image_14.jpg
  • Metallic iridium fit performed with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ir

    • Elements: Ir

    • Sample composition: Ir

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_904_image_14.jpg
  • Fitting of metallic osmium with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os

    • Elements: Os

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_903_image_14.jpg
  • Fit of metallic rhenium performed with a correlated doublet and the shape of the double Lorentzian curve with bacgrond narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Re

    • Elements: Re

    • Sample composition: Re

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_902_image_14.jpg
  • Tungsten metal tuning performed with a correlated doublet and the shape of the double Lorentzian curve with a narrow Shirley background
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_901_image_14.jpg
  • Metallic tantalum tuning performed with a correlated doublet and the shape of the double Lorentzian curve with background narrow Shirley
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ta

    • Elements: Ta

    • Sample composition: Ta

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_900_image_14.jpg
  • Fitting of metallic hafnium with a correlated doublet and the shape of the HD curve with Shirley narrow background
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hf

    • Elements: Hf

    • Sample composition: Hf

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_899_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfO2

    • Elements: Hf, Si, O

    • Sample composition: HfO2/HfSiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_877_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfO2

    • Elements: Hf, Si, O

    • Sample composition: HfO2/HfSiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_880_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfO2

    • Elements: Hf, Si, O

    • Sample composition: HfO2/HfSiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_879_image_14.jpg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfO2

    • Elements: Hf, Si, O

    • Sample composition: HfO2/HfSiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_878_image_14.jpg
  • Nitridation of HfO2/Si
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfON/Si

    • Elements: Si, Hf, O and N

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_876_image_14.jpg
  • Nitridation of HfO2/Si
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfON/Si

    • Elements: Si, Hf, O and N

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_875_image_14.jpg
  • Nitridation of HfO2/Si
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfON/Si

    • Elements: Si, Hf, O and N

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_874_image_14.jpg
  • Nitridation of HfO2/Si
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: HfON

    • Elements: Si, Hf, O and N

    • Sample composition: HfO1.66N0.33

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher Scientific

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_873_image_14.jpg
  • Fitting of the C 1s photoemision spectrum, from a Y2(CO3)3/LaB6 sample. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Y2(CO3)3

    • Elements: Y C O

    • Sample composition: Y2(CO3)3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_862_image_14.jpg
  • Fitting of the C 1s photoemision spectrum, from a CuCO3 powder on tape. The spectrum was fitted employing four Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Powder

    • Sample material: CuCO3

    • Elements: Cu C O

    • Sample composition: CuCO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_864_image_14.jpg
  • Fitting of the Ge 2p photoemision spectrum. The spectrum was fitted employing three Voigt peaks, where two of them were correlated by their area (olive green peaks). Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Powder

    • Sample material: Pure selenium

    • Elements: Se

    • Sample composition: Se

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_870_image_14.jpg
  • Fitting of the Ge 2p photoemision spectrum. The spectrum was fitted employing four Gaussian peaks and one Voigt peak, all of them being doublets. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pure germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_869_image_14.jpg
  • Fitting of the Al 2p photoemision spectrum. The spectrum was fitted employing one doublet Voigt peak. Data were provided by Dr Anders Barlow (the use of the spectrum requieres acknowledging the following article http://dx.doi.org/10.1002/sia.6417).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: AlPO4

    • Elements: Al P O

    • Sample composition: TeO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 5

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_868_image_14.jpg
  • Fitting of the Te 3d photoemision spectrum, from a 3 mm TeO2 pellet. The spectrum was fitted employing four Voigt peaks, of which two were doublets (purple and olive green). Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: TeO2

    • Elements: Te O

    • Sample composition: TeO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.76

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_866_image_14.jpg
  • Fitting of the C 1s photoemision spectrum, from a MgCO3 powder on tape. The spectrum was fitted employing four Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Powder

    • Sample material: MgCO3

    • Elements: Mg C O

    • Sample composition: MgCO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_863_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of Copper sulfide (CuS), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted)
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Cu

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_775_image_14.jpg
  • Posting without JS

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  • This is a title

    This is a content

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    Information about the sample:

    • Shape: Powder

    • Sample material: H2O x2

    • Sample composition: H2O

    Data acquisition parameters:

    • Photon source: Al Ka

    • Pass energy: 1203.5 eV

    • Take-off angle: 565 eV

    Equipment and analysis software:

    • Brand: Azus

    • Model: FX505

    • Spectrometer mode: Mode on, 150 eV

    • Software used: aanalyzer

  • Fitting of the O 1s photoemision spectrum, from a Y2(CO3)3/LaB6 sample. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Y2(CO3)3/LaB6

    • Elements: Y C O La B

    • Sample composition: Y2(CO3)3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_832_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a CuCO3 powder on tape. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Powder

    • Sample material: CuCO3

    • Elements: Cu C O

    • Sample composition: CuCO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_836_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a LiCO3 sample produced by a CO2 attack on LiOH powder. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Powder

    • Sample material: LiCO3

    • Elements: Li C O

    • Sample composition: LiCO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_834_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a MgCO3 powder on tape. The spectrum was fitted employing two Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Powder

    • Sample material: MgCO3

    • Elements: Mg C O

    • Sample composition: MgCO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_833_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a 3 mm Ga2O3 pellet. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ga2O3

    • Elements: Ga O

    • Sample composition: Ga2O3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.76

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_831_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a 3 mm TeO2 pellet. The spectrum was fitted employing three Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: TeO2

    • Elements: Te O

    • Sample composition: TeO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.76

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_830_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a K2O/SiO2 exposed bulk mesh. The spectrum was fitted employing two Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: K2O/SiO2

    • Elements: K O Si

    • Sample composition: K2O

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.99

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_828_image_14.jpg
  • Fitting of the O 1s photoemision spectrum, from a 3 mm Sb2O3 pellet. The spectrum was fitted employing two Voigt peaks. Data were provided by Vincent Crist (the use of the spectrum requieres acknowledging XPS library website, https://xpslibrary.com/).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sb2O3

    • Elements: Sb O

    • Sample composition: Sb2O3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 30.01

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_827_image_14.jpg
  • Testing the ability to upload posts

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    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_823_image_14.jpg
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_822_image_14.jpg
  • XPS Neo Test

    C1s data taken from XPS Oasis and refit in XPS Neo as a test

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    Files :

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Graphite

    • Elements: C, O

    • Sample composition: C

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: XPSNeo

    XPSNeo_821_image_1.pngXPSNeo_821_image_0.png
  • XPS Neo Test

    C1s data taken from XPS Oasis and refit in XPS Neo as a test

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    Files :

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Graphite

    • Elements: C, O

    • Sample composition: C

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: XPSNeo

    XPSNeo_818_image_1.pngXPSNeo_818_image_0.png
  • Spectrum and fitting of S 2p from copper-zinc sulfide (CuZnS), experimental data were obtained from films fabricated using a chemical bath.
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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Cu, Zn

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_779_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of mercury sulfide (HgS), data were provided by Vincent Crist (The use of the spectrum requires acknowledging the XPS library website, https://xpslibrary.com/, and the data is copyrighted).
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Hg

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_778_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of molybdenum sulfide (MoS2), data were provided by Vincent Crist (The use of the spectrum requires acknowledging the XPS library website, https://xpslibrary.com/, and the data is copyrighted).
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Mo

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_777_image_14.jpg
  • Spectra and fitting of S 2p from Copper Sulfide (CuS) obtained by the SILAR method with 100 cycles.
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Cu

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_776_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of tantalum sulfide (TaS2), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted)
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Ta

    • Sample composition: TaS2

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_774_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of iron sulfide (FeS2), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted)
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Fe

    • Sample composition: FeS2

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_773_image_14.jpg
  • Fitting of the S 2p photoemission spectrum of metallic sulfur, data were obtained from the PHI Handbook.
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_770_image_14.jpg
  • Besides using a DL, a extra peak was added
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Metallic nickel

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_769_image_14.jpg
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S, Ta

    • Sample composition: TaS2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_751_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material:

    • Elements:

    • Sample composition:

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: XPS Escalab 250Xi

    • Model:

    • Spectrometer mode:

    • Software used: aanalyzer

    aanalyzer_767_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: SPECS

    • Software used: aanalyzer

    aanalyzer_766_image_14.jpg
  • This post is described in the document titled "A formal expression for the photoemission signal and the angular transmission function" that can be found at http://www.qro.cinvestav.mx/~aherrera/reportesInternos/formalExpressionXPSIntensity.pdf
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: metallic nickel

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: large angle small area

    • Software used: aanalyzer

    aanalyzer_765_image_14.jpg
  • Fitting of the S 2p photoemission spectrum for the element (research grade), data were obtained from the PHI Handbook
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    Files :

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    Information about the sample:

    • Sample material: Sulfur

    • Elements: S

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_734_image_14.jpg
  • June 4, 5 PM CT

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  • June 3, 5 PM CT

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  • high-quality metallic copper layers produced by sublimation. With annealing at 300°C for 3h in a quartz tube furnace exposed to a flow of 20 sccm ultra-high purity molecular oxygen
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: CuO

    • Elements: Cu, O

    • Sample composition: CuO0.98

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Model: Alpha XPS110

    • Software used: aanalyzer

    aanalyzer_729_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Tungsten Oxide

    • Elements: W/O

    • Sample composition: WO2/WO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_727_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Tungsten

    • Elements: W/O

    • Sample composition: WO2/WO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_726_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Tungsten

    • Elements: W/O

    • Sample composition: WO2/WO3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_725_image_14.jpg
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    Files :

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    Information about the sample:

    • Sample material: Tungten

    • Elements: W/O

    • Sample composition: WO3/WO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_724_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Tungsten

    • Elements: W

    • Sample composition: W/W-Ox

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_723_image_14.jpg
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    Files :

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    Information about the sample:

    • Sample material: tungsten

    • Elements: W

    • Sample composition: W

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_722_image_14.jpg
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    Files :

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    Information about the sample:

    • Sample material: Aluminum Oxide

    • Elements: Al. O

    • Sample composition: Al2O3, AlO

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85, 75, 65

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_719_image_14.jpg
  • All spectra were aligned to the reported value of 72.6 eV.
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    aanalyzer_718_image_14.jpg
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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Aluminum Oxide

    • Elements: Al, O

    • Sample composition: Al2O3, AlO

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85-35

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_715_image_14.jpg
  • very clean gold film
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_714_image_14.jpg
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_713_image_14.jpg
  • This is the cleanest si we could get. It is H-terminated.
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    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_712_image_14.jpg
  • Hello,

    I would like to signal a bug:
    The color of the first peak “0” can be modfied but is not saved in the .par file and always come back to black color.

    Regards,

    My configuration: Windows 11 pro 22H2 

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    Information about the sample:

    • Shape: Flat Surface

  • Barium aluminate with Cerium nanoparticles. Overlap between the peak of Barium MNN and Ce3d. The fit still does not convince me. The data are protected by copyright.
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    Information about the sample:

    • Shape: Powder

    • Sample material: BaAlO4+Ce

    • Elements: Ba, Al, Ce

    • Sample composition: BaAlO4

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_705_image_14.jpg
  • Oxidation of ultra-pure copper film in a quartz tubular furnace at 300°C for 3h, to achieve a full oxidation. The equipment employed to acquire X-ray photoelectron spectra was assembled by Intercovamex (Morelos, Mexico); the experimental data collection instrumentation consists of an XR5 monochromatic Al Kα1 (hν = 1486.7 eV) X-ray source and a hemispheric spectrometer model XPS110 equipped with a seven-channel electron multiplier detector provided by ThermoFisher (East Grinstead, UK). During the data acquisition, the background pressure was kept around 9×10-11 Torr
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Copper

    • Elements: Cu

    • Sample composition: CuO0.98

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 0.1

    • Take-off angle: 85

    Equipment and analysis software:

    • Model: Thermo Alpha110

    • Spectrometer mode: MONO

    • Software used: aanalyzer

    aanalyzer_704_image_14.jpg
  • The first peak from right to left corresponds to sp2 and the second to sp3. The other three peaks correspond to adventitious surface carbon.
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Graphite

    • Elements: C, O

    • Sample composition: C

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: Thermofisher

    • Spectrometer mode: Small area, large angle

    • Software used: aanalyzer

    aanalyzer_700_image_14.jpg
  • This is an alternative fit for the data of the paper 4. "Oxidation mechanism of metallic chromium at room temperature". https://doi.org/10.1016/j.apsusc.2020.148636 I use a doble lorentzina peak for the main peaks plus and a doblet of Voigt.
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Sample material: Cr Metal

    • Elements: Cr

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha 110

    • Software used: aanalyzer

    aanalyzer_699_image_14.jpg
  • Muestras en polvo de PdCo propiedad del Centro de Investigación y Desarrollo Tecnológico en Electroquímica, S. C.
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    Information about the sample:

    • Sample material: PdCo

    • Elements: Pd

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_698_image_14.jpg
  • Muestras en polvo de PdCo propiedad del Centro de Investigación y Desarrollo Tecnológico en Electroquímica, S. C.
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    Information about the sample:

    • Sample material: PdCo

    • Elements: Co

    Data acquisition parameters:

    • Photon source: Al Ka

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_697_image_14.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Data acquisition parameters:

    • Photon source: Synchrotron. Energy

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_695_image_14.jpg
  • Bi 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Bismuth

    • Elements: Bi

    • Sample composition: Bi

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: aanalyzer

    aanalyzer_693_image_14.jpg
  • Bi 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Bi

    • Elements: Bi

    • Sample composition: Bi 4f

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: aanalyzer

  • Database
    Fe 2p peak-fitting from an iron oxide film, the peak areas obtained in the fitting allows for the calculation of the expected composition (Fe2.00±0.05O3) by modeling the background as a combination of Shirley-type (Shirley-Vegh-Salvi-Castle) and slope backgrounds through the active approach. It is important that a double-Lorentzian lineshape was used to model the multiplet structure. For more information please refer to DOI: 10.1002/sia.6124
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Hematite

    • Elements: Fe; O

    • Sample composition: Fe2.00±0.05 : O3

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: Small area large angle

    • Software used: Analyzer

    xpsoasis_394_image_100.jpg
  • Showing HOPG C 1s spectra from different sources
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: HOPG

    • Elements: C

    Data acquisition parameters:

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: Kratos

    xpsoasis_679_image_100.png
  • Fitting of the Au 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Au

    • Elements: Au

    • Sample composition: Au

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_602_image_100.jpg
  • please download it, fit it and post it as a comment
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    Files :

    • You must be logged-in to download data

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_668_image_100.jpg
  • download the data, fit it, and post it as a comment
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: clean silicon

    • Elements: Si

    • Sample composition: Si

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_664_image_100.png
  • download the data, fit it, and post it as a comment
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: SiO2/Si

    • Elements: Si, O

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_663_image_100.png
  • download the data, fit it and post is as a comment
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: HfO2/Si

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Spectrometer mode: small area, large angle

    xpsoasis_662_image_100.png
  • download the data, fit it and post it as a comment
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: HfO/SiO/Si

    • Elements: Hf, O, Si

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_660_image_100.png
  • download the data and try to fit it; then, post it as a comment
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    Information about the sample:

    • Shape: Flat Surface

    • Elements: Ni, O

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: small area, large angle

    xpsoasis_658_image_100.png
  • 1

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  • is the blue peak necessary ?
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Re 4f

    • Elements: Re

    • Sample composition: Re

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_647_image_100.jpg
  • Fitting of the Pd 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). 
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    xpsoasis_641_image_100.png
  • 10 eV Pass energy was used
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Mn Met

    • Elements: Mn

    • Sample composition: Mn

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: Small area large angle

    • Software used: AAnalyzer

    xpsoasis_552_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Nanowires

    • Sample material: SiO2

    • Elements: Si,O

    • Sample composition: SiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_408_image_100.jpg
  • Hg 4f spectrum obtained from metallic mercury flat surface, published data were provided by Phy handbook of X-ray photoelectron spectroscopy.The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hg 4f

    • Elements: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_630_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by DOI: 10.1103/PhysRevMaterials.3.025001.The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_628_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    • Elements: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_623_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sample information

    • Elements: Os 4f/5p

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: Data acquisition parameters

    • Take-off angle: 15

    Equipment and analysis software:

    • Brand: Equipment information

    • Model:

    • Spectrometer mode:

    • Software used: AAnalyzer

    xpsoasis_620_image_100.jpg
  • Hg 4f spectrum obtained from metallic Mercury flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hg 4f

    • Elements: Gh

    • Sample composition: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_621_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f/5p

    • Elements: Os

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_619_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pt

    • Elements: Pt

    • Sample composition: Pt

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_618_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Vanadium Oxide

    • Elements: V, O

    • Sample composition: VxOy

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha110

    • Software used: AAnalyzer

    xpsoasis_616_image_100.jpg
  • Hg 4f spectrum obtained from metallic Mercury flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hg 4f

    • Elements: Hg

    • Sample composition: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_615_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    • Elements: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_614_image_100.jpg
  • Fitting of the Ta 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ta

    • Elements: Ta

    • Sample composition: Ta

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_605_image_100.jpg
  • Fitting of the Ir 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ir

    • Elements: Ir

    • Sample composition: Ir

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_612_image_100.jpg
  • From Vince database, data adquire on April 2003.
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    Information about the sample:

    • Elements: Thallium

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 14.27

    Equipment and analysis software:

    • Spectrometer mode: FAT

    • Software used: AAnalyzer

    xpsoasis_611_image_100.jpg
  • Fitting of the Re 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Re

    • Elements: Re

    • Sample composition: Re

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_610_image_100.jpg
  • Fitting of the Re 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Re

    • Elements: Re

    • Sample composition: Re

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_609_image_100.jpg
  • Fitting of the Ir 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
    Read more

    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_608_image_100.jpg
  • Fitting of the Pt 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Sample material: Pt

    • Elements: Pt

    • Sample composition: PT¡t

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_607_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: W

    • Elements: W

    • Sample composition: W

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_606_image_100.jpg
  • Fitting of the Hf 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Hf

    • Elements: Hf

    • Sample composition: Hf

    xpsoasis_604_image_100.jpg
  • Fitting of the Hg 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hg

    • Elements: Hg

    • Sample composition: Hg

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_603_image_100.jpg
  • Fitting of the Au 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Au

    • Elements: Au

    • Sample composition: Au

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_601_image_100.jpg
  • Database
    Fit if the core level Sn 3d from pure Tin. Data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).Read more
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: pure Tin

    • Elements: Sn

    • Sample composition: Sn

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_596_image_100.png
  • Database
    Fitting of the Ag 3d photoemission spectrum for the element (research grade). Data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted).Read more
    Read more

    Information about the sample:

    • Sample material: Silver

    • Elements: Ag

    • Sample composition: Ag

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 14.34

    • Take-off angle: 90°

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_593_image_100.png
  • Database
    The main doublet was fitted with three symetric Voigt doublets (shown in navy blue, blue and aqua). The spectra was obtained from the surface of a metallic nickel thick sample deposited by thermal sublimation in UHV conditions. Data included in a Master Degree Thesis (Guzmán-Bucio et al. "Oxidation mechanim of metallic nickel," to be published).
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Ni

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    • Software used: Analyzer

    xpsoasis_346_image_100.jpg
  • Fitting of the Pb 4f photoemission spectrum for a poly crystalline surface, data were published by Engelhard and Baer. (accession #0057402). The main photoemission line was fitted using an asymmetric Double-Lorentzian doublet. The branching ratio was forced to be equal to the theoretically expected value (0.7863), which was taken from the Scofield tables. Data were obtained from: Mark Engelhard and Don Baer , "Third Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 7, 1-68 (2000) https://doi.org/10.1116/1.1311915
    Read more

    Information about the sample:

    • Shape: Otherpolycrystal

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 23.5

    Equipment and analysis software:

    • Brand: Physical Electronics, Incorporated Quantum 2000

    • Model: 11-066

    • Spectrometer mode: constant pass energy

    • Software used: AAnalyzer

    xpsoasis_580_image_100.jpg
  • The use of the spectrum requires acknowledging https://xpslibrary.com/, the data is copyrighted. X-ray incident angle: 55°. The fit required the use of asymmetric double-Lorentzian lineshapes for the main peak. The SVSC parameter of the satellites is about the same as for the main peak.Read less
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: indium

    • Elements: In

    • Sample composition: In

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 14.3

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: FAT

    • Software used: Analyzer

    xpsoasis_494_image_100.jpg
  • Database
    The use of the spectrum requires acknowledging https://xpslibrary.com/, the data is copyrighted. X-ray incident angle: 55°. The fit required the use of asymmetric double-Lorentzian lineshapes for the main peak. The SVSC parameter for the satellites is about 5 times larger than for the main peak. The fit for Sn 3d (post #493) is similar. The uncertainties were calculated using a gain of 4.8 (48 scans, 0.1 dwelling time). Read less
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: pure Cd

    • Elements: Cd

    • Sample composition: Cd

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 14.3

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: FAT

    • Software used: Analyzer

    xpsoasis_491_image_100.png
  • Fitting of the Ag 3d photoemission spectrum for the element (research grade), data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). Read more
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Silver Ag (3d5) & Ag (3d3)

    • Elements: Pure Ag

    • Sample composition: Ag

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_497_image_100.jpg
  • The use of the spectrum requires acknowledging https://xpslibrary.com/, the data is copyrighted. X-ray incident angle: 55°. The fit required the use of asymmetric double-Lorentzian lineshapes for the main peak. The SVSC parameter of the satellites is slightly smaller that from the main peak. The fit is slightly off in the circled regions.
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Tin

    • Elements: Sn

    • Sample composition: Sn

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_493_image_100.jpg
  • Ga in InGaAs substrate treated thermally at 300 °C.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: InGaAs

    • Elements: In, Ga, As

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_560_image_100.png
  • InGaAs deposited by MBE on GaAs substrate. As 3d in InGaAs treated thermally at 300 °C.Read more
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: InGaAs

    • Elements: InGaAs

    Data acquisition parameters:

    • Pass energy: 15

    • Take-off angle: 85

    xpsoasis_559_image_100.jpg
  • The use of the spectrum requires acknowledging https://xpslibrary.com/, the data is copyrighted.
    Read more

    Information about the sample:

    • Sample material: GaAs

    • Elements: Ga, As, O

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.92

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_557_image_100.jpg
  • Ta 4f spectrum obtained from metallic Tantalum flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ta 4f

    • Elements: Ta

    • Sample composition: Ta

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: FAT

    • Software used: AAnalyzer

    xpsoasis_554_image_100.jpg
  • W 4f spectrum obtained from metallic Tungsten flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: W 4f

    • Elements: W

    • Sample composition: W

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: FAT

    • Software used: AAnalyzer

    xpsoasis_553_image_100.jpg
  • Database
    O 1s spectra was obtained from the surface of a hafnium oxide sample that was deposited by atomic layer deposition over Si(1 0 0) wafers. The component at ~530 eV is associated to Hf-O bonding in hafnium oxide. The component at 532 eV has contributions from the oxygen of the superficial hydroxil groups and from the oxygen in hafnium silicate at the interface HfO2/Si.
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Hafnium oxide

    • Elements: Hf, O, Si

    • Sample composition: HfO2/HfSiO2/Si

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Take-off angle: 85°

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: large angle, small area

    xpsoasis_198_image_100.jpg
  • Which life-time width should I use? Which fitting software do you recommend?
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: HfO2/SiO2/Si

    • Elements: Si, O, Hf

    • Sample composition: HfO2/SiO2

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_545_image_100.png
  • The use of the spectrum requires acknowledging Lab. B15 "LPCN" CINVESTAV Qro, the data is copyrighted. Fitting of the Ti 2p photoemission spectrum for the element (research grade). The double Lorentzian for the main peak was divided into two singlest with correlated areas
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Ti

    • Elements: Ti

    • Sample composition: Ti

    xpsoasis_543_image_100.jpg
  • Database
    The use of the spectrum requires acknowledging https://xpslibrary.com/, the data is copyrighted. The double Lorentzian for the main peak was divided into two singlest with correlated areas.
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Pd 3d

    • Elements: Pd

    • Sample composition: Pd

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 14.3

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand:

    • Model:

    • Spectrometer mode: FAT

    • Software used: AAnalyzer

    xpsoasis_526_image_100.jpg
  • Fitting of the Pt 4f photoemission spectrum from a poly crystalline Pt foil, data were published by Engelhard and Baer. (accession #0057102). The spectrum was fitted employing five doublets. The asymmetry of the main line is reproduced with one Double-Lorentzian doublet. The branching ratio was forced to be equal to the theoretically expected value (0.7873), which was taken from the Scofield tables. Data were obtained from: Mark Engelhard and Don Baer, "Third Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 7, 1-68 (2000) https://doi.org/10.1116/1.1311915Read more
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Pt foil

    • Elements: Pt

    • Sample composition: Pt

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 23.5

    • Take-off angle: 45°

    Equipment and analysis software:

    • Brand: Physical Electronics, Inc.

    • Model: 11-066

    • Spectrometer mode: constant pass energy

    • Software used: AAnalyzer

    xpsoasis_509_image_100.png
  • Fitting of the Ir 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The spectrum was fitted employing three Voigt doublets. The branching ratio was forced to be equal to the theoretically expected value (0.7866), which was taken from the Scofield tables. The fit needs to be optimized, since it fails to reproduce the data in the circled region (~50 eV).
    Read more

    Information about the sample:

    • Shape: Other :element

    • Sample material: Ir

    • Elements: Ir

    • Sample composition: Ir

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 14.25

    • Take-off angle: 90°

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_506_image_100.png
  • Fitting of the Lu 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The spectrum was fitted employing five Voigt doublets. The branching ratio was forced to be equal to the theoretically expected value (0.7906), which was taken from the Scofield tables.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Lu

    • Elements: Lu

    • Sample composition: Lu

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 29.65

    • Take-off angle: 90

    xpsoasis_504_image_100.png
  • The spectra were obtained from the surface of a metallic nickel thick sample exposed to UHP O2 at 300°C for 20 min in a tubular furnace. The six doublets are associated to NiO.
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: oxidized nickel film

    • Elements: Ni, O, C

    • Sample composition: NiO

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: various

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    • Software used: Analyzer

    xpsoasis_501_image_100.png
  • Fitting of the Bi 4f photoemission spectrum for the element (research grade), data were provided by Vincent Crist (The use of the spectrum requires acknowledging XPS library website, https://xpslibrary.com/, the data is copyrighted). The spectrum was fitted employing one asymmetric Double-Lorentzian doublet and two gaussian doublets. The branching ratio was forced to be equal to the theoretically expected value (0.7863), which was taken from the Scofield tables.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Bi

    • Elements: Bi

    • Sample composition: Bi

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 14.25

    • Take-off angle: 90°

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_490_image_100.png
  • Fitting of the Re 4f photoemission spectrum for a metallic poly crystalline surface, data were published by Engelhard and Baer. (accession #0056902). The spectrum was fitted employing six Voigt doublets. The branching ratio was forced to be equal to the theoretically expected value (0.7871), which was taken from the Scofield tables. Data were obtained from: Mark Engelhard and Don Baer , "Third Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 7, 1-68 (2000) https://doi.org/10.1116/1.1311915
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Re

    • Elements: Re

    • Sample composition: Re

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 23.5

    • Take-off angle: 45°

    Equipment and analysis software:

    • Brand: Physical Electronics, Incorporated Quantum 2000

    • Model: 11-066

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

    xpsoasis_489_image_100.png
  • Fitting of the Tl 4f photoemission spectrum for a poly crystalline surface, data were published by Engelhard and Baer. (accession #0057302). The spectrum was fitted employing one asymmetric Double-Lorentzian doublet and five Gaussian doublets. The branching ratio was forced to be equal to the theoretically expected value (0.7866), which was taken from the Scofield tables. Data were obtained from: Mark Engelhard and Don Baer , "Third Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 7, 1-68 (2000) https://doi.org/10.1116/1.1311915
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Tl

    • Elements: Tl

    • Sample composition: Tl

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 23.5 eV

    • Take-off angle: 45°

    Equipment and analysis software:

    • Brand: Physical Electronics, Incorporated Quantum 2000

    • Model: 11-066

    • Spectrometer mode: constant pass energy

    xpsoasis_488_image_100.png
  • In the fitting parameters screen, I am not able to constrain areas to a certain range. If I input a range for the areas to be limited to, the area parameters simply go out of range every time I attempt to fit the peaks to the data. Has anyone else experienced this issue or discovered a fix for it? Also, please do not use the fitting uploaded with this post. It is incomplete and likely inaccurate.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: ALD-Grown Cobalt Oxide

    • Elements: Co, O

    • Sample composition: Co3O4

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    Equipment and analysis software:

    • Brand: ULVAC-PHI

    • Model: VersaProbe III

    • Software used: Analyzer

  • Growth in RTA @800°C by 290s, then etching, this data corresponds to the last etching at 1800s. ARXPS 0-65°
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Si wafer

    • Elements: Si2p

    • Sample composition: SiOx

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0-65

    Equipment and analysis software:

    • Brand: SPECS

    • Model: Phoibos 150

    • Spectrometer mode: MediumArea:1.5kV

    • Software used: Analyzer

    xpsoasis_477_image_100.png
  • Read more

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_456_image_100.jpg
  • Fitting of the Ge 3d photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032903). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.6865), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read less
    Read more

    Information about the sample:

    • Shape: Other :single crystal

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

    xpsoasis_470_image_100.png
  • Fitting of the Ge 2p photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032902). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.5184), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read moreRead moreRead more
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    xpsoasis_469_image_100.png
  • Fitting of the V 2p photoemission spectrum for a polycrystalline metallic surface, data were published by Lawson et al. (accession #0032402). The apparent asymmetry of the main photoemission line was modeled employing two symmetric Voigt doublets. Another three Voigt doublets were employed to optimize the fitting. The branching ratio of the five components was forced to be equal to the theoretically expected value (0.5165), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read less
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Polycrystalline metallic Vanadium

    • Elements: V

    • Sample composition: V

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

    xpsoasis_468_image_100.png
  • Fitting of the V 2p photoemission spectrum for a polycrystalline metallic surface, data were published by Lawson et al. (accession #0032902). The apparent asymmetry of the main photoemission line was modeled employing the Double-Lorentzian asymmetric line-shape. Another three Voigt doublets were employed to optimize the fitting. The branching ratio of the four components was forced to be equal to the theoretically expected value (0.5165), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read more
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Polycrystalline metallic Vanadium

    • Elements: V

    • Sample composition: V

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

    xpsoasis_467_image_100.png
  • K 2p photoemission spectrum obtained from a KBr surface cleaved in air. The branching ratio of the two doublets were forced to be equal to the theoretically expected values, which were taken from the Scofield tables. The data were published by Vincent Crist. B. Vincent Crist, "KBr Crystal: Cleaved in Air", Surface Science Spectra 1, 292-296 (1992) https://doi.org/10.1116/1.1247654Read more
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Potassium bromide

    • Elements: K, Br

    • Sample composition: KBr

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 25

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Surface Science Instruments

    • Model: X-Probe 206

    • Spectrometer mode: constant pass energy

    xpsoasis_461_image_100.png
  • Hf 4f spectrum obtained from a polycrystalline metallic hafnium foil, data were published by Arranz and Palacio (accession #00876-02). The spectrum was fitted with one asymmetric Double-Lorentzian doublet, its branching ratio was forced to be equal to the theoretically expected value taken from the Scofield Tables. A. Arranz and C. Palacio , "Core Level Spectra of Hafnium and Hafnium Nitride (HfN0.9) by XPS", Surface Science Spectra 11, 33-42 (2004) https://doi.org/10.1116/11.20050103Read more
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Hf

    • Elements: Hf

    • Sample composition: Hf

    Data acquisition parameters:

    • Photon source: Mg Ka

    • Pass energy: 16

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: SPECS EA

    • Model: 10 model

    • Spectrometer mode: constant pass energy

    • Software used: AAnalyzer

    xpsoasis_459_image_100.png
  • Read more

    Files :

    • You must be logged-in to download data

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_448_image_100.jpg
  • Datos de oxigeno O1s para el curso de Principios de Caractrización
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    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_432_image_100.jpg
  • Database
    ZnO film deposited by sol-gel-method
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: ZnO

    • Elements: O, Zn, C

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: Standard

    xpsoasis_214_image_100.jpg
  • Database
    Data from Vince Crist (https://xpslibrary.com/b-vincent-crist-ceo/). The spectrum is good enough to determine the Lorentzian width, which resulted different from bulk silicon. (US Government data copyright number TX 4-560-881.)
    Read more

    Information about the sample:

    • Sample material: Quartz

    • Elements: Si, O

    • Sample composition: SiO2

    Equipment and analysis software:

    • Brand: Kratos

    • Software used: Analyzer

    xpsoasis_328_image_100.png
  • Read more

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 54.9

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_427_image_100.jpg
  • Spectra obtain from https://xpslibrary.com/xps-aes-spectra-libraries/
    Read more

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_426_image_100.png
  • Spectra obtain from https://xpslibrary.com/xps-aes-spectra-libraries/
    Read more

    Data acquisition parameters:

    • Pass energy: 54.9

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_425_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Powder

    • Sample material: CNT

    • Elements: C

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_423_image_100.jpg
  • Fluorine obtained during sublimation of metallic Yttrium (Sigma Aldrish 99.9%). The presence of fluorine could be because it is used during the yttrium purification. Data obtained at different currents used during sublimation. Flourine increases as current increase
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Flourine

    • Elements: F

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha110

    • Spectrometer mode: MonoXPS

    • Software used: AAnalyzer

    xpsoasis_422_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Aluminum

    • Elements: Al

    • Sample composition: Al

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 35-85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha110

    • Spectrometer mode: MonoXPS

    • Software used: AAnalyzer

    xpsoasis_421_image_100.jpgxpsoasis_421_image_100.jpg
  • Read more

    Information about the sample:

    • Sample material: TiN

    • Elements: O

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_403_image_100.jpg
  • Database
    Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Nanowires

    • Sample material: SiO2

    • Elements: Na,Si, O

    • Sample composition: Na

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_410_image_100.jpg
  • Database
    Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Nanoparticle

    • Sample material: SiO2

    • Elements: Si,O,Ca

    • Sample composition: Ca

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_411_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Nanowires

    • Sample material: SiO2

    • Elements: S

    • Sample composition: S

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_409_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: Al

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_407_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: C

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_406_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: Ti,N

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_405_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: N

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_404_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: Ti, N

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpaha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_402_image_100.jpg
  • Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: FeO

    • Elements: Fe, O

    • Sample composition: FeO

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    xpsoasis_400_image_100.jpg
  • Se 3d spectrum obtained from ZnSe film
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: ZnSe film

    • Elements: Zn, Se

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_399_image_100.png
  • Ga 3d in InGaAs substrate treated thermally at 300 °C.
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: InGaAs substrate

    • Elements: In, Ga, As

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 85

    xpsoasis_398_image_100.png
  • Pure metalic chromium deposited by sublimation (99.999 purity, Sigma Aldrich). Data hace already published in Oxidation mechanism of metallic chromium at room temperature”, Applied Surface Science 542 (2021). https://doi.org/10.1016/j.apsusc.2020.148636
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Metallic Cr

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 35-85

    Equipment and analysis software:

    • Brand: Thermofisher

    • Model: Alpha 110

    • Software used: AAnalyzer

    xpsoasis_397_image_100.jpg
  • This spectrum has been shared with students from a course of XPS data analysis. They will post possible fits as comments to this post.
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: copper oxide

    • Elements: O, Cu, C

    • Sample composition: Cu2O + CuO

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_154_image_100.jpg
  • The spectrum was obtained from a metallic nickel surface. The four doublets are associated to metallic nickel.
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Metallic Ni

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThemoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    • Software used: AAnalyzer

    xpsoasis_387_image_100.jpg
  • The spectrum was obtained from a metallic nickel surface. The four doublets are associated to metallic nickel.
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Metallic Ni

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThemoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    • Software used: AAnalyzer

    xpsoasis_386_image_100.jpg
  • Database
    The red, fushia, and olive-green peaks correspond to the 1+, 2+, and 3+ suboxides (parameters from Himpsel et al. Surf. Inter. Anal. 21. 44-50 (1994)). The green peak is the ST peak described in the paper titled "The ST component in the Si 2p photoemission spectrum from clean and oxidized Si [001] surfaces" (to be publish).
    Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: silicon oxide layer

    • Elements: Si, O

    • Sample composition: SiO2, Si

    xpsoasis_380_image_100.jpg
  • Database
    This fit is a slight variation of that published in Surf. Interface Anal. 52, 591-599 (2020). https://doi.org/10.1002/sia.6796. The fit is very complex; this is why, even though Fe 2p is widely studied core level, its fit hadn't been reported before 2020. This is the result of a simultaneous fit to iron films of different thicknesses, resulting in a robust fit.
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: metallic iron

    • Elements: Fe

    • Sample composition: Fe

    Data acquisition parameters:

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    • Software used: Analyzer

    xpsoasis_373_image_100.jpg
  • InGaAs substrate deposited by MBE technique.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: InGaAs substrate

    • Elements: In, As, Ga

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    Equipment and analysis software:

    • Software used: Analyzer

    xpsoasis_370_image_100.png
  • The spectra were obtained from a partially oxidized nickel surface and were fitted with the software AAnalyzer(R). The two components at lower binding energy (displayed in olive green) are associated with Ni2O3, the component at higher binding energy (displayed in purple) is associated with adventitious oxygen. Data included in a Master Thesis (Guzmán-Bucio, Dulce M. Mecanismo de oxidación de níquel metálico, Cinvestav, Querétaro).
    Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Partially oxidized Ni

    • Elements: Ni, O, C

    • Sample composition: Ni2O3

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: various

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    • Software used: AAnalyzer

    xpsoasis_350_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: FeO

    • Elements: Fe, O

    • Sample composition: Fe0

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Model: ALpha 110

    xpsoasis_220_image_100.jpg
  • Database
    The spectra were obtained from the surface of a metallic nickel thick sample exposed to UHP O2 at 100°C for 8 min in a tubular furnace. The spectra were fitted through the block approach* and are displayed normalized. The main peak (shown in olive green) corresponds to the metallic component; the five doublets are associated to the oxide components. Data included in a Master Degree Thesis (Guzmán-Bucio et al. "Oxidation mechanism of metallic nickel," to be published). * A. Herrera-Gómez, F.S. Aguirre-Tostado, Y. Sun, P. Pianetta, Z. Yu, D. Marshall, R. Droopad, W.E. Spicer, Photoemission from the Sr/Si(001) interface, J. Appl. Phys. 90 (2001) 6070–6072. https://doi.org/10.1063/1.1415758.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Partially oxidized Ni

    • Elements: Ni, O, C

    • Sample composition: Ni2O3

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: various (from top to bottom 90°, 70°, 50°, 40°)

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    xpsoasis_348_image_100.jpg
  • Database
    The main photoemission line (displayed in blue) was fitted with a Double-Lorentzian lineshape. The spectra was obtained from the surface of a metallic nickel thick sample deposited by thermal sublimation in UHV conditions. Data included in a Master Degree Thesis (Guzmán-Bucio et al. "Oxidation mechanism of metallic nickel," to be published).
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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Ni

    • Elements: Ni

    • Sample composition: Ni

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: small area, large angle

    xpsoasis_344_image_100.jpgxpsoasis_344_image_100.jpg
  • Testing the data file
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  • Ultra pure copper film (oxygen and carbon free). GW fixed for both branches, free LW,
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    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Spectrometer mode: mono

    xpsoasis_307_image_100.jpg
  • This post is for a peak-fitting test for students of the Universidad Autonoma de Queretaro.
    Read more

    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    xpsoasis_280_image_100.jpg
  • Fitting exercise for the Material's Characterization Course at the Universidad Autónoma de Querétaro
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: SiC on silicon

    • Elements: Si, C, O

    • Sample composition: SiC/Si

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

  • Fitting exercise for the Material's Characterization course at the Universidad Autónoma de Querétaro
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: clean Au film on Si

    • Elements: Au

    • Sample composition: Au

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_231_image_100.png
  • Oxigeno para aluminio oxidado
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    Information about the sample:

    • Sample material: ?

    • Elements: ?

    • Sample composition: ?

    Data acquisition parameters:

    • Pass energy: ?

    • Take-off angle: ?

    Equipment and analysis software:

    • Brand: ?

    • Model: ?

    • Spectrometer mode: ?

    xpsoasis_228_image_100.jpg
  • Read more
    xpsoasis_222_image_100.jpg
  • C in TiO2 powder synthetized by Molten Salt method
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    Information about the sample:

    • Shape: Powder

    • Sample material: TiO2_MS

    • Elements: Ti, O, C

    • Sample composition: TiO2

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    xpsoasis_219_image_100.jpg
  • C in PbS film deposited by chemical bath deposition method
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: PbS

    • Elements: Pb, S, O, C

    • Sample composition: PbS

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    xpsoasis_218_image_100.jpg
  • C in ZnO films deposited by Sol-Gel Method
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: ZnO

    • Elements: Zn, C, O

    • Sample composition: ZnO

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    xpsoasis_217_image_100.jpg
  • C in ZnO films deposited by sputtering. Three components are observed which can be associated to C-C, C-O and C=O bonds.
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: ZnO

    • Elements: Zn, C, O

    • Sample composition: ZnO

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    xpsoasis_216_image_100.jpg
  • C 1s spectra was obtained from the surface of a nickel thick sample that was exposed to ultra pure oxygen at 100°C for 8 minutes in the tubular furnace. The peaks at 284.56, 286.50, and 288.15 eV correspond to C-C, C-O, and C=O bonds, all present in adventitious carbon. The peak at 292.62 eV probably is associated to compounds with C-C, C-O and C-H bonds or physisorbed CO2. Finally, the peak at 282.98 eV is diffused carbon, respectively. Data included in a Master Thesis (Guzmán-Bucio, Dulce M. Mecanismo de oxidación de níquel metálico, Cinvestav, Querétaro)
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Nickel (III) oxide

    • Elements: Ni, O, C

    • Sample composition: Ni2O3.13

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90°

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    xpsoasis_203_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Fe

    • Elements: C

    • Sample composition: FeO

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Model: XPS110

    • Spectrometer mode: MONOXPS

    xpsoasis_194_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: C

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Model: XPS110

    • Spectrometer mode: MONOXPS

    xpsoasis_193_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: TiN

    • Elements: O

    • Sample composition: TiN

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Model: XPS 110

    • Spectrometer mode: MONOXPs

    xpsoasis_192_image_100.jpg
  • PbS thin film obtanied with the use of chemical solution deposition
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: PbS

    • Elements: PbS

    • Sample composition: PbS

    Data acquisition parameters:

    • Photon source: Mg Ka

    • Pass energy: 18

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: PHI

    • Model: 5100

    xpsoasis_187_image_100.jpg
  • please propose a fit
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    Information about the sample:

    • Sample material: covellite

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    xpsoasis_186_image_100.png
  • please propose a fit
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    Information about the sample:

    • Sample material: SnS

    • Sample composition: SnS

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    xpsoasis_185_image_100.png
  • please propose a fit
    Read more

    Information about the sample:

    • Sample material: ZnS

    • Elements: Zn, S

    • Sample composition: ZnS

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    xpsoasis_184_image_100.png
  • S 2p photoemission spectrum of an as-deposited copper sulfide thin film obtained via chemical solution deposition. For further details about film preparation and possible interpretation for the photoemission peaks please refer to https://doi.org/10.1016/j.apsusc.2019.03.054
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    Information about the sample:

    • Sample material: amorphous copper sulfide

    • Elements: Cu; S

    • Sample composition: CuS1.7

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: Thermo Scientific

    • Model: ESCALAB 250Xi

    xpsoasis_148_image_100.jpg
  • this sample was prepared at 800 C and 145 seconds with oxygen flow at low pressure in the quartz tube
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Silicon wafer

    • Sample composition: SiO2

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Take-off angle: 5-65

    Equipment and analysis software:

    • Model: 110

    xpsoasis_127_image_100.png
  • Data published in https://doi.org/10.1016/j.mssp.2019.104825. The data comprises samples annealed at 200, 300, and 400 °C for 2 hours in air. The resultant spectra is fingerprint of cobalt spinel
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    Information about the sample:

    • Shape: OtherThin Film

    • Sample material: cobalt oxide

    • Elements: Co; O

    • Sample composition: Co3O4

    Data acquisition parameters:

    • Photon source: Mg Ka

    • Pass energy: 18

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: PerkinElmer PHI

    • Model: 5100

    xpsoasis_122_image_100.jpg
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sn 3d

    • Elements: Sn, O

    • Sample composition: SnO

    Data acquisition parameters:

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Model: xps 110

    xpsoasis_75_image_100.jpg
  • XPS fitting of Cr2p. Sample were oxidized at atmospheric conditions for 15 min
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    Information about the sample:

    • Shape: Flat surface

    • Sample composition: Cr2O3,CrO3

    Data acquisition parameters:

    • Pass energy: 10

    Equipment and analysis software:

    • Brand: Thermoficher

    • Model: Alpha110

    • Spectrometer mode: MonoXPS

    xpsoasis_92_image_100.jpg
  • Database
    Published data from Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2p obtained with Al Kα radiation: I: cobalt spinel DOI 10.1002/sia.5933
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Sample material: Cobalt Spinel

    • Elements: Co;O

    • Sample composition: Co3O4

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: Angular Data

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: 110

    xpsoasis_35_image_100.jpg
  • Database
    Read more

    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Nickel

    • Elements: Ni

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Brand: -

    • Model: -

    • Spectrometer mode: -

    xpsoasis_100_image_100.jpg
  • Hi, I am trying to fit the angular spectra of Sn 3d, those were obtained first using Sn in its pure metallic form and then it was exposed to oxygen for 10 seconds to obtain an early oxidation state. The problem is, as can be seen, both spectra share the same peaks.
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    Files :

    • You must be logged-in to download data

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sample information

    • Elements: Sample information

    • Sample composition: ?

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: Data acquisition parameters

    Equipment and analysis software:

    • Brand: Equipment information

    • Model: Equipment information

    • Spectrometer mode: ?

    xpsoasis_62_image_100.jpg
  • InGaAs deposited by MBE on GaAs substrate. In 3d in InGaAs treated thermally at 300 °C.
    Read more

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: InGaAs

    • Elements: In

    • Sample composition: In0.2Ga0.8As

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ?

    • Model: ?

    • Spectrometer mode: ?

    • Software used: Analyzer

    xpsoasis_58_image_100.png
  • Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sn3d

    • Elements: Sn, O

    • Sample composition: SnO

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    Equipment and analysis software:

    • Model: XPS 110

    • Spectrometer mode: MONO

    xpsoasis_34_image_100.jpg