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  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by DOI: 10.1103/PhysRevMaterials.3.025001.The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_628_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    • Elements: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_623_image_100.jpg
  • excluded the 5p peak in the analysis. Fixed the restrictions on Gaussians and areas. The circled region can be improved.
    Read more

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_622_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Sample information

    • Elements: Os 4f/5p

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: Data acquisition parameters

    • Take-off angle: 15

    Equipment and analysis software:

    • Brand: Equipment information

    • Model:

    • Spectrometer mode:

    • Software used: AAnalyzer

    xpsoasis_620_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f/5p

    • Elements: Os

    • Sample composition: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_619_image_100.jpg
  • Os 4f spectrum obtained from metallic Osmium flat surface, published data were provided by Vincent Crist (XPS library website, https://xpslibrary.com/). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables
    Read more

    Information about the sample:

    • Shape: Flat surface

    • Sample material: Os 4f

    • Elements: Os

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Software used: AAnalyzer

    xpsoasis_614_image_100.jpg

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